zhy1
发表于 2017-3-31 09:45
赶紧排个队,见见传说中的人物{:6_652:}
ipho
发表于 2017-3-31 09:45
第二页也要抢一个
超强电子
发表于 2017-3-31 09:46
重出江湖了
但以理
发表于 2017-3-31 10:29
利害{:5_639:}
dragoncool
发表于 2017-3-31 10:43
教主重出江湖
jkgo
发表于 2017-3-31 10:46
一开始以为是仿号结果不是,教主从没和别人起过争执。话说这一条没回都到第三页了。{:5_639:}
Prophet
发表于 2017-3-31 11:01
水贴
CoOOH表层分解, 正负极溶解/分解, 隔板劣化等. [Mechanisms causing capacity loss
on long term storage in NiMH system, 1998]
陈旧内容。当时还没有eneloop。超晶格储氢合金还没有用于电池。99年东芝才首次用于电池。
钴形成的导电层分解破坏前提是电池过放电。长期存放自放电导致电池电压极低。
eneloop 05年11月推向市场。厂家难道不知道。存放期间只要开路电压1V以上就没事。
Prophet
发表于 2017-3-31 11:06
1, 使用磺化的隔板
6, 使用丙烯酸接枝聚丙烯的隔板
你这些都是抄来的。
就性能而言,磺化隔膜性能最好。能将自放电降到最低。
但是光用磺化隔膜,自放电降低仍有限。还需要其它材料配合。
钴包覆正极材料、钴添加剂、超晶格储氢合金等等。
超晶格储氢合金,sanyo FDK 技术水平最高。
Prophet
发表于 2017-3-31 11:11
楼猪该不会有去吹嘘镍镉吧。
镍氢负极材料,储氢合金存在不可逆损伤问题。特别是长期存放电压过低。
镍镉无此问题。充放电循环能够恢复。
镍镉寿命极长,公认的电池界老寿星。
可以任意荷电态存放。放电后短路存放也行。
我手里85年的GE产镍镉正在手电筒使用。
smallbear
发表于 2017-3-31 11:43
真的是教主
kill0929
发表于 2017-3-31 12:02
教主又回来了
jididebingzhe
发表于 2017-3-31 12:14
起码此兄是见过的最有素质的一人,没什么好说的,欢迎回来。
PBX2
发表于 2017-3-31 12:33
本帖最后由 PBX2 于 2017-3-31 12:39 编辑
教主======爱老婆这么简单就被大家知道了,也就没FDK之类的什么事了{:5_625:}
我认为教主根本就是一直没离开论坛!!!{:5_642:}
脚电筒
发表于 2017-3-31 12:38
教主回归!强烈欢迎严重欢迎
lily2350660
发表于 2017-3-31 12:51
好久没看到发帖了
kyd12345
发表于 2017-3-31 12:57
我靠 教主复活了
hxh428
发表于 2017-3-31 13:04
很久没有见了呢。
100zhang
发表于 2017-3-31 14:14
必须来看教主,好久没有看到了!
吾见刚正
发表于 2017-3-31 14:38
聚四氟乙烯(Teflon或PTFE),俗称“塑料王”,是由四氟乙烯经聚合而成的高分子化合物,具有优良的化学稳定性、耐腐蚀性、密封性、高润滑不粘性、电绝缘性和良好的抗老化耐力。用作工程塑料,可制成聚四氟乙烯管、棒、带、板、薄膜等。一般应用于性能要求较高的耐腐蚀的管道、容器、泵、阀以及制雷达、高频通讯器材、无线电器材等。
mfkdmrd9
发表于 2017-4-1 10:10
Abstract
Capacity recovery after long term storage and loaded storage is a critical issue with the NiMH system since its inception. A measurable loss in capacity is observed when cells are stored for long periods of time or discharged deeply to zero volts. The different mechanisms that are known to cause self discharge and capacity loss after storage and loaded storage will be the focus of this paper. Capacity loss after long term storage involves two main events. One is self discharge which causes the open circuit voltage(OCV) of the cell to drop. Self discharge is caused by decomposition of NiOOH, migration of metal ions and possible degradation of separator. Self discharge can be prevented by using separators which are stable at high temperatures and pH and have good ion trapping capability. Various separator types and treatments can play an important role in inhibiting metal ions from migrating thus reducing self discharge. Self discharge during storage causes a severe suppression in the voltage of the foam positive electrode. This drop in voltage causes a breakdown of the cobalt conductive network in the nickel positive electrode. Reduction of high valence cobalt(III) which forms the electrode's conductive network takes place at these low voltages. A permanent breakdown in the conductive network results in low efficiency of the cell on consecutive charge and discharge cycles. In addition, the cobalt in its lower valence states can migrate away from the electrode into the separator causing shorts. These events effect the charge and discharge efficiency of these cells thereby resulting in capacity loss. Various mechanisms causing self discharge which affect capacity recovery after long term storage and loaded storage are discussed in this paper.
Research paper insights: Mechanisms Causing Capacity Loss on Long Term Storage in NiMH System. Available from: https://www.researchgate.net/publication/231922305_Mechanisms_Causing_Capacity_Loss_on_Long_Term_Storage_in_NiMH_System .